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dc.contributor.authorRestrepo Girón, Andrés David
dc.contributor.authorLoaiza Correa, Humberto
dc.date.accessioned2020-10-01T01:00:20Z
dc.date.available2020-10-01T01:00:20Z
dc.date.issued2010-07-22
dc.identifier.issn0120-5609
dc.identifier.urihttps://repository.usc.edu.co/handle/20.500.12421/4343
dc.description.abstractAn image processing algorithm detects and replaces abnormal pixels individually, highlighting them amongst their neighbours in a sequence of thermal images without affecting overall texture, like classical filtering does. Bad pixels from manufacture or constant use of a CCD device in an IR camera are thus detected and replaced with a very good success rate, thereby reducing the risk of bad interpretation. Some thermal sequences from CFRP plates, taken by a Cincinnati Electronics InSb IR camera, were used for developing and testing this algorithm. The results were compared to a detailed list of bad pixels given by the manufacturer (about 70% coincidence). This work becomes relevant considering that the number of papers on this subject is low; most of them talk about astronomical image pre-processing. Moreover, thermographic non-destructive testing (TNDT) techniques are gaining popularity in Colombia at introductory levels in industrial sectors such as energy generation and transmission, sugar production and military aeronautics.es
dc.language.isoenes
dc.publisherIngenieria e Investigaciones
dc.subjectInfrared imagees
dc.subjectNon-destructive testing (NDT)es
dc.subjectPixel correctiones
dc.subjectThermographyes
dc.titleA new algorithm for detecting and correcting bad pixels in infrared imageses
dc.typeArticlees


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